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2015 Vol.26, Issue 5 Preview Page
25 October 2015. pp. 275-282
1.K. H. Lyum, S. U. Park, S. M. Yang, H. K. Yoon, and S. Y. Kim, “Precise measurement of ultra small retardation of rubbed polyimide alignment layer using an improved transmission ellipsometer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 24, 77-85 (2013).10.3807/KJOP.2013.24.2.077
2.K. H. Lyum, H. K. Yoon, S. J. Kim, S. H. An, and S. Y. Kim, “Study of ultra-small optical anisotropy profile of rubbed polyimide film by using transmission ellipsometry,”  J. Opt. Soc. Korea 18, 156-161 (2014).10.3807/JOSK.2014.18.2.156
3.J. H. Lee, M. S. Park, S. M. Yang, S. U. Park, M. H. Lee, and S. Y. Kim, “Precise measurement of ultra small anisotropy of rubbed polyimide using an improved reflection ellipsometer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 26, 195-202 (2015).10.3807/KJOP.2015.26.4.195
4.D. W. Berreman, “Optics in stratified and anisotropic media: 4x4-matrix formalism,” J. Opt. Soc. Am. 62, 502-510 (1972).10.1364/JOSA.62.000502
5.I. Hirosawa, “Method of characterizing rubbed polyimide film for liquid crystal display devices using reflection ellipsometry,” Jpn. J. Appl. Phys. 35, 5873-5875 (1996).10.1143/JJAP.35.5873
6.P. Yeh and C. Gu, Optics of Liquid Crystal Displays (John Wiley & Sons, Inc., New York, USA, 1999), Chapter 3 and Chapter 8.
7.A. Lien, “Extended Jones matrix representation for the twisted nematic liquid-crystal display at oblique incidence,” Appl. Phys. Lett. 57, 2767-2769 (1990).10.1063/1.103781
8.S. Y. Kim, “Ellipsometric expressions of multilayered substrate coated with a uniaxially anisotropic alignment layer,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 24, 271-278 (2013).10.3807/KJOP.2013.24.5.271
9.S. Y. Kim, “Ellipsometric expressions for two uniaxially anisotropic layers coated on a multilayered substrate,” Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 26, 115-120 (2015).10.3807/KJOP.2015.26.2.115
10.J. W. Ryu, Ph. D. Thesis, Ajou University, Suwon (2010).
11.R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, Netherlands, 1987), Chapter 4.
12.E. Hecht, Optics (Addison-Wesley Publishing Co., Massachusetts, USA, 1987), Chapter 8.
13.O. S. Heaven, Optical Properties of Thin Films (Dover Publication, Inc., 1955).
14.S. Y. Kim, Ellipsometry (Ajou University Press, Gyeonggi, Korea, 2000), Chapter 3-4.
  • Publisher :Optical Society of Korea
  • Publisher(Ko) :한국광학회
  • Journal Title :Korean Journal of Optics and Photonics
  • Journal Title(Ko) :한국광학회지
  • Volume : 26
  • No :5
  • Pages :275-282
  • Received Date :2015. 07. 23
  • Revised Date :2015. 09. 02
  • Accepted Date : 2015. 09. 14